Billede af bogens forside - CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

Bog, Hardback, Engelsk, 2009

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Priser fra 4 boghandlere

Bogdetaljer

  • SprogEngelsk
  • IndbindingHardback
  • ISBN9781605111285
  • Udgivet19/11/2009
  • Udgivet afMaterials Research Society
  • Længde194 sider
  • GenreBusiness og læring